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Abstract：
Fresnoite (Ba2TiSi2O8, BTS) thin films were grown on polished Si(100) substrates by sol-gel method. The films were characterized using Fourier transform infrared spectroscopy (FTIR), Raman scattering spectroscopy, X-ray diffraction (XRD) and atom force microscopy (AFM). The results reveal that the crystallinity of fresnoite thin films increases and their structures become more compact as post-annealing temperature increases. Combined with XRD data, the strong FTIR peaks and Raman bands assigned to Ti-O and Si-O vibration indicate the formation of fresnoite phase in the films at a temperature of 750 degreesC. Besides, the AFM observation showed the films have a smooth surface, fine grains and dense structure. (C) 2004 Elsevier B.V. All rights reserved.
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MATERIALS LETTERS
ISSN： 0167-577X
Year： 2004
Issue： 22-23
Volume： 58
Page： 2927-2931
3 . 0 0 0
JCR@2022
ESI Discipline： MATERIALS SCIENCE;
JCR Journal Grade：2
Cited Count：
WoS CC Cited Count： 19
SCOPUS Cited Count： 19
ESI Highly Cited Papers on the List： 0 Unfold All
WanFang Cited Count：
Chinese Cited Count：
30 Days PV： 3
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