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Author:

郭伟玲 (郭伟玲.) | 李志国 (李志国.) | 周天夷 (周天夷.) | 孙英华 (孙英华.) | 张万荣 (张万荣.) | 沈光地 (沈光地.)

Indexed by:

CQVIP PKU

Keyword:

温度梯度 可靠性 金属化 VLSI 电迁徙

Author Community:

  • [ 1 ] [郭伟玲]北京工业大学
  • [ 2 ] [李志国]北京工业大学
  • [ 3 ] [周天夷]北京工业大学
  • [ 4 ] [孙英华]北京工业大学
  • [ 5 ] [张万荣]北京工业大学
  • [ 6 ] [沈光地]北京工业大学

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Source :

微电子学

ISSN: 1004-3365

Year: 1998

Page: 59-63

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 9

Affiliated Colleges:

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