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Author:

李志国 (李志国.) | 赵瑞东 (赵瑞东.) | 李学信 (李学信.) | 郭伟玲 (郭伟玲.) | 程尧海 (程尧海.) | 张斌 (张斌.)

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CQVIP

Keyword:

应力试验 TI/MO 肖特基势垒接触 电徙动 GAAS 失效机理

Author Community:

  • [ 1 ] [李志国]北京工业大学%电子部55所
  • [ 2 ] [赵瑞东]北京工业大学%电子部55所
  • [ 3 ] [李学信]北京工业大学%电子部55所
  • [ 4 ] [郭伟玲]北京工业大学%电子部55所
  • [ 5 ] [程尧海]北京工业大学%电子部55所
  • [ 6 ] [张斌]北京工业大学%电子部55所

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Source :

电子产品可靠性与环境试验

ISSN: 1672-5468

Year: 1995

Page: 23-29

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 8

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