Abstract:
本文介绍发展了一种扫描探针显微镜(SPM)与扫面电子显微镜(SEM)联合测试系统,将SPM集成到SEM样品室内,两种仪器有机的结合,实现了仪器功能互补.本文重点介绍了该系统基于SPM微悬臂梁探针的原位三点弯曲和纳米压痕纳米力学测试方法和技术,该系统成为针对单体纳米材料定量力学性能原位测试与表征,以及纳米力学性能与微观结构相关性研究与表征的综合实验平台.
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Year: 2012
Page: 124-127
Language: Chinese
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
Chinese Cited Count:
30 Days PV: 12
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