• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Ban Zhaowei (Ban Zhaowei.) | Qin Fei (Qin Fei.) (Scholars:秦飞) | An Tong (An Tong.) | Xia Guofeng (Xia Guofeng.) | Liu Chengyan (Liu Chengyan.)

Indexed by:

CPCI-S

Abstract:

Infrared thermography has become increasingly important for non-destructive testing to detect internal defections, involving delaminations, cracks and voids. In this paper, the principle of infrared thermography is presented briefly. And a finite element approach is proposed to simulate the process of infrared thermography nondestructive testing about QFN packages. By changing with the length and the thickness of the delamination and the size of uniform surface heat flux, the surface thermal characteristics of a QFN are analyzed. The simulation results can provide basis and reference for the following work to detect defects in packages by infrared thermography method.

Keyword:

QFN Packages finite element method delamination infrared thermography

Author Community:

  • [ 1 ] [Ban Zhaowei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [An Tong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Xia Guofeng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Liu Chengyan]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Ban Zhaowei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP)

Year: 2011

Page: 519-522

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

Online/Total:636/10645284
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.