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Author:

郭伟玲 (郭伟玲.) | 李志国 (李志国.) | 孙英华 (孙英华.) | 程尧海 (程尧海.)

Indexed by:

CQVIP PKU

Abstract:

对具有Al-Si-Pd/TiN/Ti/PtSi/Si(样品A)和Al-Si-Pd/Ti/PtSi/Si(样品B)两种新型金属化结构的微波管的EB结在不同温度、相同电流条件下进行了加速寿命试验,得到其中值寿命(MTF)相差近一倍,激活能分别为0.92和0.79eV,并给出了在温度和电流应力下EB结反向击穿特性的变化规律

Keyword:

微波器件 可靠性 金属化系统

Author Community:

  • [ 1 ] 北京工业大学电子工程系可靠性物理室

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Source :

半导体技术

Year: 1997

Issue: 03

Page: 29-33

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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