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Author:

袁泉 (袁泉.)

Indexed by:

CQVIP

Abstract:

从实际应用的需要出发,对改善白光散斑技术的测试效果在实验方法上进行了详细的探讨.结果表明,改进后的白光散斑技术可用于现场大范围位移的测试,且干涉条纹质量及测量精度有了很大的提高.

Keyword:

面内位移 白光散斑 干涉条纹

Author Community:

  • [ 1 ] 北京工业大学应用物理系

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Source :

北京工业大学学报

Year: 1995

Issue: 03

Page: 101-105

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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