Abstract:
本文对G.A.Lang等关于功率晶体管热疲劳失效研究的理论模型提出了商榷意见,并给出了其补正形式和解析解。这一结果也适用于其他具有多层结构的电子器件。
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Source :
电子学报
Year: 1986
Issue: 03
Page: 123-125
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 11
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