Correlation of emission behavior and surface feature of Scandia doped dispenser cathodes - Details

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CPCI-S

Abstract：

In　this　work　we　investigated　the　correlation　between　the　emission　properties　of　Scandia　doped　dispenser　cathodes　and　their　surface　features.　A　proposal　for　explanation　of　the　observed　phenomena　has　been　suggested.

Keyword：

surface analysis work function thermionic emission scandate cathode

Author Community：

[ 1 ] [Wang, Jinshu]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China
[ 2 ] [Wang, Yanchun]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China
[ 3 ] [Wang, Yiman]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China
[ 4 ] [Li, Lili]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China
[ 5 ] [Liu, Wei]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China
[ 6 ] [Zhang, Xizhu]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100022, Peoples R China

Reprint Author's Address：

王金淑
[Wang, Jinshu]Beijing Univ Technol, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, 100 Pingleyuan, Beijing 100022, Peoples R China

Email：

wang_yiman@bjut.edu.cn

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Related Keywords：

Correlation Between Emission Behavior and Surface Features of Scandate Cathodes
2009，IEEE TRANSACTIONS ON ELECTRON DEVICES
Emission property of impregnated cathode with Y2O3 and Sc2O3 co-doped tungsten substrate
2009，10th IEEE International Vacuum Electronics Conference
Performance of high current density cathodes with Scandia doped tungsten powders
2006，7th IEEE International Vacuum Electronics Conference (IVEC)/6th IEEE International Vacuum Electron Sources Conference (IVESC)
Development of high current-density cathodes with scandia-doped tungsten powders
2007，IEEE TRANSACTIONS ON ELECTRON DEVICES

Source ：

2008 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE

Year： 2008

Page： 66-67

Language： English

Cited Count：

WoS CC Cited Count： 1

SCOPUS Cited Count： 2

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 8

Affiliated Colleges：

材料科学与工程学院本学院/部未明确归属的数据

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