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Author:

Li, Xiao-yan (Li, Xiao-yan.) | Yan, Yong-chang (Yan, Yong-chang.) | Liu, Na (Liu, Na.)

Indexed by:

CPCI-S

Abstract:

A thermodynamics-based damage mechanics rate dependent constitutive model is used to simulate experiments conducted on thin layer eutectic SnAgCu(SAC) solderjoints. The non-damage constitutive is measured by bulk tensile test. The relationship between true stress and strain is sigma=85.260.3536. Damage evolution equation is proposed based Lemaitre ductile damage theory and the constant in the equation is measured by unloading elastic modulus method. The damage evolution equation is D=1.0689 epsilon P-0.0008. Simulation (using software Ansys 9.0) of shear test of solder joint between Cu sticks employing damage mechanics rate independent constitutive is uniform to practicable test.

Keyword:

Author Community:

  • [ 1 ] [Li, Xiao-yan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Yan, Yong-chang]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Liu, Na]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Li, Xiao-yan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China

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Source :

2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2

Year: 2008

Page: 1073-1076

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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