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Author:

Li, Shao-hua (Li, Shao-hua.) | Zhang, Ming-ju (Zhang, Ming-ju.) (Scholars:张明聚) | Li, Peng-fei (Li, Peng-fei.) (Scholars:李鹏飞)

Indexed by:

EI Scopus SCIE

Abstract:

This paper focuses on the ground settlement induced by the construction of a curved shield tunnel. Ground loss and construction loadings are the two factors causing ground settlement, and two corresponding analytical models were developed. First, the ground settlement due to ground loss was analyzed based on 3D image theory. The "integrative gap at shield tail" (IGST) and overcutting gap of a curved tunnel were considered. Second, the ground settlement due to construction loadings was analyzed by modifying Mindlin's solutions. The additional thrust, frictional force, and grouting pressure were considered. Subsequently, a case study and a parameter analysis were conducted. Finally, the obtained solutions were compared with a classical analytical solution, numerical simulations, and monitored results. The proposed model could effectively predict the ground settlement induced during curved shield tunneling.

Keyword:

U455 TU744 Curved tunnel Ground loss Image theory 43 Ground settlement s solution Mindlin&#8217

Author Community:

  • [ 1 ] [Li, Shao-hua]Beijing Univ Technol, Minist Educ, Key Lab Urban Secur & Disaster Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Ming-ju]Beijing Univ Technol, Minist Educ, Key Lab Urban Secur & Disaster Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Li, Peng-fei]Beijing Univ Technol, Minist Educ, Key Lab Urban Secur & Disaster Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Shao-hua]China Railway 15th Bur Grp Co Ltd, Shanghai 200070, Peoples R China

Reprint Author's Address:

  • 李鹏飞

    [Li, Peng-fei]Beijing Univ Technol, Minist Educ, Key Lab Urban Secur & Disaster Engn, Beijing 100124, Peoples R China

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Source :

JOURNAL OF ZHEJIANG UNIVERSITY-SCIENCE A

ISSN: 1673-565X

Year: 2021

Issue: 4

Volume: 22

Page: 296-313

3 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:87

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 43

SCOPUS Cited Count: 52

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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