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Author:

Zhang, H.H. (Zhang, H.H..) | Ji, X.L. (Ji, X.L..) | Han, S.Y. (Han, S.Y..) | Fan, L.F. (Fan, L.F..) (Scholars:范立峰)

Indexed by:

EI Scopus SCIE

Abstract:

T-stress plays an important role in the fracture of various materials, and is frequently adopted as a second fracture parameter in addition to the stress intensity factor. In this paper, the T-stresses for cracks in both homogeneous and functionally graded materials under thermal loadings are computed by the numerical manifold method (NMM), which is very suitable for crack modeling due to the use of bi-cover systems. After the calculation of temperature and displacement fields by the NMM solver, the T-stress is extracted through the domain-independent interaction integral. The proposed method is verified through two benchmark problems and then applied to study three more complex cases where the effects of material parameters and crack configurations on the T-stress are further examined. © 2021 Elsevier Ltd

Keyword:

Numerical methods Numerical models Functionally graded materials Cracks

Author Community:

  • [ 1 ] [Zhang, H.H.]School of Civil Engineering and Architecture, Nanchang Hangkong University, Nanchang; Jiangxi; 330063, China
  • [ 2 ] [Ji, X.L.]School of Civil Engineering and Architecture, Nanchang Hangkong University, Nanchang; Jiangxi; 330063, China
  • [ 3 ] [Han, S.Y.]School of Civil Engineering and Architecture, Nanchang Hangkong University, Nanchang; Jiangxi; 330063, China
  • [ 4 ] [Fan, L.F.]College of Architecture and Civil Engineering, Beijing University of Technology, Beijing; 100084, China

Reprint Author's Address:

  • [han, s.y.]school of civil engineering and architecture, nanchang hangkong university, nanchang; jiangxi; 330063, china

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Source :

Theoretical and Applied Fracture Mechanics

ISSN: 0167-8442

Year: 2021

Volume: 113

5 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:87

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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