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Author:

Deng, Wenjie (Deng, Wenjie.) | You, Congya (You, Congya.) | Zhang, Yongzhe (Zhang, Yongzhe.) (Scholars:张永哲)

Indexed by:

EI Scopus SCIE

Abstract:

Imaging sensors as a critical technology are greatly significant in numerous light detection applications including security monitor, smart mobile devices, machine vision, navigation, self-driving, drones and remote sensing etc. In particular, spectral imaging technology such as multispectral and hyperspectral imaging are attracting more and more attention due to the available spectral and spatial information, which provide an opportunity for deeper cognition of the detected object. However, conventional strategy for wavelength sensing by complicated optical system has obstacle in achieving lightweight, low cost, high quality image and high pixel densities. Therefore, new emerging strategies based on the nanomaterials and nanostructures involving filter-assisted and filter-free light detection are explored to achieve precise spectral discrimination. Here, we review the latest advances of these emerging approaches for spectral discrimination. Furthermore, every filter-assisted and filter-free strategy was discussed and compared in detail by analyzing their fundamental physical principles.

Keyword:

Optical sensors Information filters Absorption Spectral discrimination Photodetectors photodetector Optical filters nanomaterials nanostructures optoelectronic

Author Community:

  • [ 1 ] [Deng, Wenjie]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 2 ] [You, Congya]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 张永哲

    [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing Key Lab Microstruct & Property Adv Mat, Key Lab Adv Funct Mat,Educ Minist China, Beijing 100124, Peoples R China

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Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2021

Issue: 4

Volume: 21

Page: 4044-4060

4 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:87

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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