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Author:

An, Xin (An, Xin.) | Li, Jinghong (Li, Jinghong.) | Xu, Shuo (Xu, Shuo.) (Scholars:徐硕) | Chen, Liang (Chen, Liang.) | Sun, Wei (Sun, Wei.) (Scholars:孙威)

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SSCI EI Scopus SCIE

Abstract:

Patent similarity measurement, as one of the fundamental building blocks for patent analysis, is able to derive technical intelligence efficiently, but also can detect the risk of infringement and evaluate whether the invention meets the criteria of novelty and innovation. However, traditional approaches make implicitly several assumptions, such as bag of words in each component, semantic direction irrelevance and so on. In order to relax these assumptions, this study proposes an improved methodology on the basis of entities and semantic relations (functional and non-functional relations), which takes semantic direction of each sequence structure and the word order information of each component into consideration. Meanwhile, an algorithm for calculating the global importance of each sequence structure is put forward. Finally, to verify the effectiveness and performance of the improved semantic analysis, a case study is conducted on the thin film head subfield in the field of hard disk drive. Extensive experimental results show that our approach is significantly more accurate. © 2021 Elsevier Ltd.

Keyword:

Semantics Risk assessment Magnetic thin film devices Patents and inventions

Author Community:

  • [ 1 ] [An, Xin]School of Economics and Management, Beijing Forestry University, Beijing; 100083, China
  • [ 2 ] [Li, Jinghong]School of Economics and Management, Beijing Forestry University, Beijing; 100083, China
  • [ 3 ] [Xu, Shuo]Research Base of Beijing Modern Manufacturing Development, College of Economics and Management, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Chen, Liang]Institute of Scientific and Technical Information of China, Beijing; 100038, China
  • [ 5 ] [Sun, Wei]Agricultural Information Institute of CAAS, Beijing; 100081, China

Reprint Author's Address:

  • 徐硕

    [xu, shuo]research base of beijing modern manufacturing development, college of economics and management, beijing university of technology, beijing; 100124, china

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Source :

Journal of Informetrics

ISSN: 1751-1577

Year: 2021

Issue: 2

Volume: 15

3 . 7 0 0

JCR@2022

ESI Discipline: SOCIAL SCIENCES, GENERAL;

ESI HC Threshold:53

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 29

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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