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Author:

Zhang, Xiaobo (Zhang, Xiaobo.) | Chen, Xiaoqing (Chen, Xiaoqing.) | Chen, Yichuan (Chen, Yichuan.) | Ouedraogo, Nabonswende Aida Nadege (Ouedraogo, Nabonswende Aida Nadege.) | Li, Jingjie (Li, Jingjie.) | Bao, Xiulong (Bao, Xiulong.) | Han, Chang Bao (Han, Chang Bao.) | Shirai, Yasuhiro (Shirai, Yasuhiro.) | Zhang, Yongzhe (Zhang, Yongzhe.) (Scholars:张永哲) | Yan, Hui (Yan, Hui.)

Indexed by:

EI Scopus SCIE

Abstract:

When the power conversion efficiency (PCE) of perovskite solar cells (PSCs) rapidly approaches that of commercial solar cells, the stability becomes the most important obstacle for the commercialization of PSCs. Aside from the widely studied slow PCE degradation, the PSCs also show a unique rapid PCE degradation. Although the degradation due to oxygen and humidity can be avoided by encapsulation, that due to bias voltage, light and heat could not be effective suppressed and will lead to considerable degradation. Usually, the rapid PCE degradation is believed to be from ion migration. However, a systematic investigation is yet to be carried out. This work quantitatively and systematically investigated the relationships between external fields (bias voltage, light or heat), ion migration and device performance. By comparing the performance of reference PSCs after 90 min degradation under these fields, we conclude that (1) the electric field affects the spatial distribution of mobile ions; (2) the light field changes the mobile ion densities and drives the ion migration; (3) the heat field results in perovskite decomposition as well as changing the mobile ion densities. In addition to the analysis of the reference device, we experimentally proved that the improved device stability upon introducing phenethylammonium iodide (PEAI) or poly-methyl methacrylate (PMMA) layers originates from the inhibition of mobile ion density and migration.

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Author Community:

  • [ 1 ] [Zhang, Xiaobo]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Chen, Yichuan]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Ouedraogo, Nabonswende Aida Nadege]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Jingjie]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 5 ] [Han, Chang Bao]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 6 ] [Yan, Hui]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 7 ] [Chen, Xiaoqing]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 8 ] [Zhang, Yongzhe]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 9 ] [Bao, Xiulong]Univ Coll Dublin, Beijing Dublin Int Coll BDIC, Sch Elect & Elect Engn, Dublin, Ireland
  • [ 10 ] [Shirai, Yasuhiro]Natl Inst Mat Sci NIMS, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan

Reprint Author's Address:

  • 张永哲

    [Chen, Xiaoqing]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China;;[Zhang, Yongzhe]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China

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Source :

NANOSCALE ADVANCES

ISSN: 2516-0230

Year: 2021

Issue: 21

Volume: 3

Page: 6128-6137

4 . 7 0 0

JCR@2022

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 24

SCOPUS Cited Count: 24

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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