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Author:

Wang, Di (Wang, Di.) | Ma, Xiaochen (Ma, Xiaochen.) | Xiao, Hongdi (Xiao, Hongdi.) | Chen, Rongrong (Chen, Rongrong.) | Le, Yong (Le, Yong.) | Luan, Caina (Luan, Caina.) | Zhang, Biao (Zhang, Biao.) | Ma, Jin (Ma, Jin.)

Indexed by:

EI Scopus SCIE

Abstract:

This study investigated the effects of growth rate on the properties of monoclinic beta-Ga2O3 films grown on SrTiO3 (100) substrates by Metal-organic Chemical Vapor Deposition. The beta-Ga2O3 films deposited at the low rate exhibited monocrystalline structure, for which the structural analyses identified the epitaxial relationship of beta-Ga2O3 (100) // SrTiO3 (100) with beta-Ga2O3 (001) // SrTiO3 (011). In the case of the same film thickness, as the growth rate increased from 2.1 to 10.1 nm.min(-1), the surface root-mean-square roughness of the /%-Ga2O3 film increased from 6.96 to 8.41 nm, and the crystalline quality decreased obviously. The prepared beta-Ga2O3 films exhibited a band gap of about 4.9 eV, and the refractive index in 450-800 nm wavelength range was 2.25-2.02. Moreover, the transmittance of all samples in the visible region was around 75%.

Keyword:

Growth rate Surface topography Epitaxial films beta-Ga2O3 Structural properties

Author Community:

  • [ 1 ] [Wang, Di]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 2 ] [Xiao, Hongdi]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 3 ] [Chen, Rongrong]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 4 ] [Le, Yong]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 5 ] [Luan, Caina]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 6 ] [Zhang, Biao]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 7 ] [Ma, Jin]Shandong Univ, Sch Microelect, Jinan 250100, Peoples R China
  • [ 8 ] [Ma, Xiaochen]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China

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Source :

MATERIALS RESEARCH BULLETIN

ISSN: 0025-5408

Year: 2022

Volume: 149

5 . 4

JCR@2022

5 . 4 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:66

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 12

SCOPUS Cited Count: 13

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

Affiliated Colleges:

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