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Author:

Zhang, Yuncheng (Zhang, Yuncheng.) | Gao, Xiang (Gao, Xiang.) | Zhang, Jiawei (Zhang, Jiawei.) | Jiao, Jingpin (Jiao, Jingpin.) (Scholars:焦敬品)

Indexed by:

EI Scopus SCIE

Abstract:

An ultrasonic reverse time migration imaging method, based on high-order singular value decomposition, is proposed in the study to solve the problems of low signal-to-noise ratio (SNR) and excessive artifacts in defect ultrasonic detection imaging results of materials with high noise levels. In this method, based on the 3D structural properties of the ultrasonic full-matrix capture data, higher-order singular value decomposition is directly performed with the 3D data. The method overcomes the difficulty in selecting the number of singular values in the original singular value decomposition noise-reduction algorithm and realizes the one-step noise reduction processing of all the signals. Subsequently, the reverse time migration imaging is performed in the frequency domain, and high-quality acoustic images are obtained. The effects of the number of array elements, the center frequency of the excitation signal, and the number of defects on the denoising effect of the algorithm are investigated. It was experimentally demonstrated that the method could suppress the interference of noise signals and significantly improve the imaging SNR compared with total focusing method and the reverse time migration.

Keyword:

ultrasonic nondestructive testing noise reduction reverse time migration higher-order singular value decomposition coarse-grained material

Author Community:

  • [ 1 ] [Zhang, Yuncheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Gao, Xiang]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Jiawei]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [Jiao, Jingpin]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China

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Source :

SENSORS

Year: 2022

Issue: 7

Volume: 22

3 . 9

JCR@2022

3 . 9 0 0

JCR@2022

ESI Discipline: CHEMISTRY;

ESI HC Threshold:53

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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