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Author:

Li, Jicheng (Li, Jicheng.) | Ye, Hongling (Ye, Hongling.) (Scholars:叶红玲) | Yuan, Boshuai (Yuan, Boshuai.) | Wei, Nan (Wei, Nan.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, a cross-resolution acceleration method for topology optimization is proposed based on deep learning aiming at achieving precise and high-efficiency geometrically non-linear structure design. We develop a cross-resolution Pix2pix neural network (CR-Pix2pix NN) to build the high-dimensional mapping between the low-resolution intermediate configuration (IC) and the corresponding high-resolution optimized configuration. Architecture of CR-Pix2pix NN is composed of a cross-resolution generator and Markovian discriminator. The cross-resolution geometrically non-linear dataset utilized to train the deep learning model is created by solving stress constrained topology optimization model established by independent continuous mapping (ICM) method. The pre-trained CR-Pix2pix NN is capable of accurately predicting the high-resolution optimized configuration by inputting the low-resolution IC with the only one iteration step. Furthermore, the hyperparameters of the developed model are discussed to ensure the performance in accuracy and computational efficiency. The proposed method can be generalized to other precise topology optimization scenarios and engineering design.

Keyword:

Cross-resolution acceleration method CR-Pix2pix NN Deep learning ICM method Geometrical non-linearity

Author Community:

  • [ 1 ] [Li, Jicheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Ye, Hongling]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Yuan, Boshuai]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [Wei, Nan]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China

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Source :

STRUCTURAL AND MULTIDISCIPLINARY OPTIMIZATION

ISSN: 1615-147X

Year: 2022

Issue: 4

Volume: 65

3 . 9

JCR@2022

3 . 9 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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