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Author:

Li, Ruidong (Li, Ruidong.) | Deng, Jinxiang (Deng, Jinxiang.) (Scholars:邓金祥) | Kong, Le (Kong, Le.) | Meng, Junhua (Meng, Junhua.) | Luo, Juxin (Luo, Juxin.) | Zhang, Qing (Zhang, Qing.) | Gao, Hongli (Gao, Hongli.) | Yang, Qianqian (Yang, Qianqian.) | Wang, Guisheng (Wang, Guisheng.) | Wang, Xiaolei (Wang, Xiaolei.)

Indexed by:

EI Scopus SCIE

Abstract:

Nb-doped beta-Ga2O3 films were deposited on p-Si (100) and quartz substrates using radio frequency magnetron sputtering technology at various substrate temperatures. All the films annealed in an argon ambient. The surface morphology and crystal structure of the films were studied using atomic force microscope and x-ray diffraction technologies, and the results indicated that the film had a flat surface and a good crystal structure when the substrate temperature was 523 K. We investigated the optical properties of the samples, and the results highlight that Nb-doped beta-Ga2O3 films exhibit high transmittance of above 80% to UV-visible light with a wavelength above 400 nm. Furthermore, the optical band gap of the Nb-doped beta-Ga2O3 films decreases with increasing substrate temperature. The electrical characteristics show that the current is larger, and that the contact between the Ag electrode and the Nb-doped beta-Ga2O3 film is an ohmic contact, when the substrate temperature is 523 K. All the results are beneficial for practical applications.

Keyword:

substrate temperature optical properties Nb-doped beta-Ga2O3 film morphology and roughness electrical characteristics

Author Community:

  • [ 1 ] [Li, Ruidong]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Deng, Jinxiang]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Kong, Le]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Meng, Junhua]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Luo, Juxin]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Qing]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 7 ] [Gao, Hongli]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 8 ] [Yang, Qianqian]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 9 ] [Wang, Guisheng]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 10 ] [Wang, Xiaolei]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 11 ] [Li, Ruidong]Inst Disaster Prevent, Dept Basic Courses, Langfang 065201, Hebei, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2022

Issue: 5

Volume: 51

Page: 2390-2395

2 . 1

JCR@2022

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:66

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 13

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