Moire　fringe,　originated　from　the　beating　of　two　sets　of　lattices,　is　a　commonly　observed　phenomenon　in　physics,　optics,　and　materials　science.　Recently,　a　new　method　of　creating　moire　fringe　via　scanning　transmission　electron　microscopy　(STEM)　has　been　developed　to　image　materials＇　structures　at　a　large　field　of　view.　Moreover,　this　method　shows　great　advantages　in　studying　atomic　structures　of　beam　sensitive　materials　by　significantly　reduced　electron　dose.　Here,　the　development　of　the　STEM　moire　fringe　(STEM-MF)　method　is　reviewed.　The　authors　first　introduce　the　theory　of　STEM-MF　and　then　discuss　the　advances　of　this　technique　in　combination　with　geometric　phase　analysis,　annular　bright　field　imaging,　energy　dispersive　X-ray　spectroscopy,　and　electron　energy　loss　spectroscopy.　Applications　of　STEM-MF　on　strain,　defects,　2D　materials,　and　beam-sensitive　materials　are　further　summarized.　Finally,　the　authors　＇　perspectives　on　the　future　directions　of　STEM-MF　are　presented.