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Author:

Guo, Longjun (Guo, Longjun.) | Liu, Wei (Liu, Wei.) | Ji, Xiaoliang (Ji, Xiaoliang.) | Zhong, Ying (Zhong, Ying.) | Hang, Chunjin (Hang, Chunjin.) | Wang, Chunqing (Wang, Chunqing.)

Indexed by:

EI Scopus SCIE

Abstract:

In this work, a multiscale coralloid nano-Cu3Sn composed of a bimodal structure (~55 and ~120 nm) has been successfully synthesized to meet low-cost and Pb-free packaging demands for high-power electronic application. Owing to the excellent oxidation resistance of the Cu3Sn intermetallic compounds (IMCs) and the protection of solvent poly(ethylene glycol)-400 (PEG-400) at high temperature, the full-Cu3Sn joints sintered in air have a comparative shear strength with the joints acquired in vacuum when the sintering temperature is no more than 300 ?. The full-Cu3Sn joints acquired at 300 ? in air achieve a high bonding strength of 40.4 MPa, which is superior to those of traditional Sn-based solder joints (19 MPa) and fullCu6Sn5 joints (17.7 MPa). The electrical resistivity of the sintered Cu3Sn films reaches 29.1 mu omega & BULL;cm in air. Cu3.02Sn0.98 is formed at the interface between the Cu substrate and sintered Cu3Sn layer, contributing to the exceptional bonding strength of the full-Cu3Sn joints. The bonding strength of the joints after high-temperature storage (HTS) tests reveals that the prepared full-Cu3Sn joints possess outstanding long-term thermal stability with a shear strength of 47.9 MPa after 800 h of storage at 250 ?. Our work breaks through the synthesis bottleneck of nano-Cu3Sn IMCs and provides the underlying insights needed to guide the design of highly stable full-IMC joints for high-temperature electronic packaging.

Keyword:

intermetallics high-temperature electronic packaging Cu-Cu bonding coralloid nano-Cu3Sn thermal stability

Author Community:

  • [ 1 ] [Guo, Longjun]Harbin Inst Technol, State Key Lab Adv Welding & Joining, Harbin 150080, Peoples R China
  • [ 2 ] [Liu, Wei]Harbin Inst Technol, State Key Lab Adv Welding & Joining, Harbin 150080, Peoples R China
  • [ 3 ] [Hang, Chunjin]Harbin Inst Technol, State Key Lab Adv Welding & Joining, Harbin 150080, Peoples R China
  • [ 4 ] [Wang, Chunqing]Harbin Inst Technol, State Key Lab Adv Welding & Joining, Harbin 150080, Peoples R China
  • [ 5 ] [Ji, Xiaoliang]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 6 ] [Zhong, Ying]Univ S Florida, Dept Mech Engn, Tampa, FL 33620 USA

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Source :

ACS APPLIED ELECTRONIC MATERIALS

Year: 2022

Issue: 7

Volume: 4

Page: 3457-3469

4 . 7

JCR@2022

4 . 7 0 0

JCR@2022

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 12

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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