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Author:

Yan, Zhengxiang (Yan, Zhengxiang.) | Sun, Guangmin (Sun, Guangmin.) | Liu, Xiucheng (Liu, Xiucheng.) | Li, Yu (Li, Yu.) | He, Cunfu (He, Cunfu.) | Xing, Zhixiang (Xing, Zhixiang.)

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EI Scopus

Abstract:

Decarburization refers to a phenomenon that the content of carbon in metal is reduced, and this could be advantageous or detrimental depending on the usage scenario. In this paper, a new feature, called Barkhausen frequency scale cepstrum coefficients (BFCCs), which was based on the cepstrum was proposed to evaluate the depth of the decarburized layer. The Genetic algorithm was used to optimize the parameters of the BFCCs feature. In the experiment part, the regression precision was compared under BFCCs and MBN envelope features using multiple linear regression (MLR) and BP neural network (BP). The regression experiment result was measured by mean absolute error (MAE) and shows the good representative ability of BFCCs for the depth of the decarburized layer. © Published under licence by IOP Publishing Ltd.

Keyword:

Linear regression Genetic algorithms Filter banks Neural networks

Author Community:

  • [ 1 ] [Yan, Zhengxiang]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Sun, Guangmin]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Liu, Xiucheng]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Li, Yu]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Xing, Zhixiang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China

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ISSN: 1742-6588

Year: 2022

Issue: 1

Volume: 2219

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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