The　atomic　force　microscope　(AFM)　is　widely　used　in　many　fields　such　as　biology,　materials,　and　physics　due　to　its　advantages　of　simple　sample　preparation,　high-resolution　topography　measurement　and　wide　range　of　applications.　However,　the　low　scanning　speed　of　traditional　AFM　limits　its　dynamics　process　monitoring　and　other　further　application.　Therefore,　the　improvement　of　AFM　scanning　speed　has　become　more　and　more　important.　In　this　review,　the　working　principle　of　AFM　is　first　proposed.　Then,　we　introduce　the　improvements　of　cantilever,　drive　mechanism,　and　control　method　of　the　high-speed　atomic　force　microscope　(HS-AFM).　Finally,　we　provide　the　next　developments　of　HS-AFM.