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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Zhao, Xin (Zhao, Xin.) | Pei, Ning (Pei, Ning.) | Huo, Zhilin (Huo, Zhilin.) | Chen, Zhengyu (Chen, Zhengyu.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.) (Scholars:吴斌)

Indexed by:

EI Scopus SCIE

Abstract:

To improve the efficiency and robustness of electromagnetic ultrasonic testing, magneto-acoustic compound inspection for ferromagnetic materials is proposed. Both ultrasonic waves and pulsed eddy current (PEC) could be obtained by the single detection of an electromagnetic acoustic transducer (EMAT), where ultrasonic waves were generated based on the coupling of the magnetostriction effect and the Lorentz force mechanism, when the EMAT was used to detect ferromagnetic materials. In this study, three simulation models of the EMAT were built by coupling different physics fields while keeping the geometry of the models unchanged and the other parameters of the EMAT constant. Transverse wave could be generated by magnetostriction force, and longitudinal wave could be generated by Lorentz force. Based on time-frequency analysis of the simulation results, the energies of ultrasonic waves and PEC were concentrated in different frequency ranges. Through the filtering strategy and by separating the time-domain signal, magnetostriction force ultrasonic wave (MFUW), Lorentz force ultrasonic wave (LFUW), and PEC could be decoupled from the EMAT testing signal. Multiple parameters can be extracted by a single detection of the EMAT, and the ability of the electromagnetic ultrasonic testing can be improved.

Keyword:

decouple Lorentz force ultrasonic wave magnetostriction force ultrasonic wave Ferromagnetic materials pulsed eddy current

Author Community:

  • [ 1 ] [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Xin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Pei, Ning]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Huo, Zhilin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Chen, Zhengyu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 6 ] [He, Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Wu, Bin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 刘增华

    [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2020

Issue: 7

Volume: 20

Page: 3476-3486

4 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:115

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count: 18

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 13

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