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Author:

He, Bao-Feng (He, Bao-Feng.) | Ding, Si-Yuan (Ding, Si-Yuan.) | Wei, Cui-E (Wei, Cui-E.) | Liu, Bing-Xian (Liu, Bing-Xian.) | Shi, Zhao-Yao (Shi, Zhao-Yao.) (Scholars:石照耀)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The measurement of surface roughness is a crucial tool for characterizing engineering surfaces. After more than 20 years of development, areal surface roughness has become a key factor that reflects the characteristics of engineering surfaces. This study includes summaries and comparisons of the characteristics of areal surface roughness, contact and non-contact measurement methods, and nanometer-scale surface roughness analysis methods. The applications and limitations of existing methods are also analyzed, and the direction for future development is presented. © 2019, Science Press. All right reserved.

Keyword:

Surface measurement Surface roughness

Author Community:

  • [ 1 ] [He, Bao-Feng]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Ding, Si-Yuan]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Wei, Cui-E]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Liu, Bing-Xian]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Shi, Zhao-Yao]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [he, bao-feng]beijing engineering research center of precision measurement technology and instruments, beijing university of technology, beijing; 100124, china

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Related Keywords:

Source :

Optics and Precision Engineering

ISSN: 1004-924X

Year: 2019

Issue: 1

Volume: 27

Page: 78-93

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 31

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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