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Author:

Long, X. (Long, X..) | Rong, L. (Rong, L..) | Lin, H. (Lin, H..) | Wang, Y. (Wang, Y..) | Zhao, J. (Zhao, J..) | Lin, S. (Lin, S..) | Wang, D. (Wang, D..)

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EI Scopus

Abstract:

Ptychography is a lensless, wide-field, diffraction imaging method that can reconstruct the object transmittance function and the probe distribution simultaneously. Traditionally, lateral mechanical movement is necessary in the time-consuming data acquisition process, resulting in disability to investigate dynamic phenomena. Single-shot ptychography is therefore proposed which divides the incident light into multiple tilted sub-probes through a beam splitting element, e.g., pinhole array and Dammann grating, meanwhile the diffraction patterns are recorded simultaneously in spatial multiplexing mode. In this study, we propose a single-shot ptychography approach using a phase-only spatial light modulator. In order to realize multi-angle modulation, four different grey images are loaded in different quadrants of the modulator, which generates a specific phase delay. Considering the inconsistent wavefront of the probe beams, multi-mode ptychographic algorithm is also adopted which treats probe beams differently. The proposed method is expected to promote single-shot ptychography for piratical applications. © 2022 SPIE.

Keyword:

phase imaging phase modulation spatial light modulator Ptychography

Author Community:

  • [ 1 ] [Long X.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Rong L.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Rong L.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 4 ] [Lin H.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Wang Y.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Wang Y.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 7 ] [Zhao J.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 8 ] [Zhao J.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 9 ] [Lin S.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 10 ] [Lin S.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 11 ] [Wang D.]Department of Physics and Optoelectronics Engineering, Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 12 ] [Wang D.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China

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ISSN: 0277-786X

Year: 2022

Volume: 12478

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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