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Author:

Wang, W. (Wang, W..) | Duan, L. (Duan, L..) | Wang, Y. (Wang, Y..) | Fan, J. (Fan, J..) | Zhang, Z. (Zhang, Z..)

Indexed by:

EI Scopus SCIE

Abstract:

Few-shot learning aims to recognize novel categories solely relying on a few labeled samples, with existing few-shot methods primarily focusing on the categories sampled from the same distribution. Nevertheless, this assumption cannot always be ensured, and the actual domain shift problem significantly reduces the performance of few-shot learning. To remedy this problem, we investigate an interesting and challenging cross-domain few-shot learning task, where the training and testing tasks employ different domains. Specifically, we propose a Meta-Memory scheme to bridge the domain gap between source and target domains, leveraging style-memory and content-memory components. The former stores intra-domain style information from source domain instances and provides a richer feature distribution. The latter stores semantic information through exploration of knowledge of different categories. Under the contrastive learning strategy, our model effectively alleviates the cross-domain problem in few-shot learning. Extensive experiments demonstrate that our proposed method achieves state-of-the-art performance on cross-domain few-shot semantic segmentation tasks on the COCO-20$^{i}$, PASCAL-5$^{i}$, FSS-1000, and SUIM datasets and positively affects few-shot classification tasks on Meta-Dataset. IEEE

Keyword:

Load modeling few-shot learning semantic segmentation cross-domain Testing Metalearning Memory Training Task analysis Semantics Prototypes

Author Community:

  • [ 1 ] [Wang W.]Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Duan L.]Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [Wang Y.]Centre for Artificial Intelligence and Robotics, (HKISI CAS)
  • [ 4 ] [Fan J.]Centre for Artificial Intelligence and Robotics, (HKISI CAS)
  • [ 5 ] [Zhang Z.]Centre for Artificial Intelligence and Robotics, (HKISI CAS)

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Source :

IEEE Transactions on Pattern Analysis and Machine Intelligence

ISSN: 0162-8828

Year: 2023

Issue: 12

Volume: 45

Page: 1-18

2 3 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:19

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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