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Author:

Zhang, Zili (Zhang, Zili.) | Chen, Sikan (Chen, Sikan.) | Wang, Lei (Wang, Lei.) | Liu, Hui (Liu, Hui.) | Liu, Yan (Liu, Yan.) | Zhao, Yue (Zhao, Yue.) | Suo, Hongli (Suo, Hongli.) | Wang, Qiuliang (Wang, Qiuliang.)

Indexed by:

EI Scopus SCIE

Abstract:

This paper presents a novel two-step procedure for measuring the critical current (I c) properties as a function of tensile stress. The proposed method completely eliminates the possible negative effect of the voltage tap used during the tensile procedure, allowing the actual I c irreversible degradation stress to be clearly determined. Six different commercial REBCO tapes from five manufacturers were tested. The I c value does not degrade until the stress reaches the 'inflection area' in the tensile curve, which corresponds to the most pronounced transformation step from elastic to plastic deformation. This allows easy estimation of the stress corresponding to I c irreversible degradation by a simple and accurate cryogenic tensile curve instead of complicated in-situ I c tensile measurement. A feasible composite-material tensile model is established to explain the phenomenon. In addition, fatigue measurements on a commercial REBCO tape from Shanghai Superconductor technology show that the tape can withstand 10 000 cycles under 580 MPa and over 5000 cycles under 695 MPa, which also is consistent with the proposed composite-materials tensile model and is confirmed by the EBSD experiments on the Hastelloy substrate. This research provides better insight and tools for designing and fabricating extremely high-field magnets.

Keyword:

fatigue I (c) irreversible degradation stress tensile test commercial REBCO tape

Author Community:

  • [ 1 ] [Zhang, Zili]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 2 ] [Wang, Lei]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 3 ] [Wang, Qiuliang]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 4 ] [Zhang, Zili]Univ Chinese Acad Sci, Shenyang 100049, Peoples R China
  • [ 5 ] [Wang, Lei]Univ Chinese Acad Sci, Shenyang 100049, Peoples R China
  • [ 6 ] [Wang, Qiuliang]Univ Chinese Acad Sci, Shenyang 100049, Peoples R China
  • [ 7 ] [Chen, Sikan]Shanghai Supercond Technol, Block 25,1388 Zhangdong Rd, Shanghai, Peoples R China
  • [ 8 ] [Zhao, Yue]Shanghai Supercond Technol, Block 25,1388 Zhangdong Rd, Shanghai, Peoples R China
  • [ 9 ] [Liu, Hui]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 10 ] [Liu, Yan]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 11 ] [Suo, Hongli]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 12 ] [Zhao, Yue]Shanghai Jiao Tong Univ, Sch Elect Informat & Elect Engn, Shanghai, Peoples R China

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Source :

SUPERCONDUCTOR SCIENCE & TECHNOLOGY

ISSN: 0953-2048

Year: 2023

Issue: 11

Volume: 36

3 . 6 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:17

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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