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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Feng, Xuejian (Feng, Xuejian.) | Chen, Honglei (Chen, Honglei.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.) (Scholars:吴斌)

Indexed by:

EI Scopus PKU CSCD

Abstract:

It is difficult to realize the quantitative detection of defects by using the time domain or frequency domain features of Lamb wave signals due to their dispersion and multi-modal characteristics. The study of defect detection quantitatively in aluminum plates is carried out by means of wavenumber analysis based on the full-optical laser ultrasonic testing system. The time-space wavefield signals are obtained by pulse laser in the fixed location excitation and continuous laser one-dimensional scanning acquisition, where the propagation characteristics of Lamb wave signal and the regular pattern of interaction between Lamb wave signal and defect can be visually displayed. The two-dimensional Fourier transform is used to convert the wavefield signal from the time-space domain to the frequency-wavenumber domain where individual modes included in the signals are well discernible. Based on the idea of short-time Fourier transform, for retaining the space information, a short-space two-dimensional Fourier transform is adopted to obtain the distribution of wavenumber along the scanning path, where the location and size of defect can be visually displayed. Furthermore, the thickness of the aluminum plates in the defect area can be calculated based on the relationship between the wavenumber and the frequency-thickness product. Experimental results show that the method can effectively evaluate the location, size and depth of the defects. © 2018 Journal of Mechanical Engineering.

Keyword:

Wavelet transforms Frequency domain analysis Surface waves Ultrasonic waves Aluminum plating Ultrasonic testing Location Laser excitation Time domain analysis Fourier series Defects

Author Community:

  • [ 1 ] [Liu, Zenghua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Liu, Zenghua]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Feng, Xuejian]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Feng, Xuejian]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Chen, Honglei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Chen, Honglei]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [He, Cunfu]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [Wu, Bin]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • 刘增华

    [liu, zenghua]college of mechanical engineering and applied electronics technology, beijing university of technology, beijing; 100124, china;;[liu, zenghua]beijing engineering research center of precision measurement technology and instruments, beijing university of technology, beijing; 100124, china

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Source :

Journal of Mechanical Engineering

ISSN: 0577-6686

Year: 2018

Issue: 18

Volume: 54

Page: 23-32

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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