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Author:

Jingpin Jiao (Jingpin Jiao.) | Wenyuan Liang (Wenyuan Liang.) | Cunfu He (Cunfu He.) | Bin Wu (Bin Wu.)

Indexed by:

incoPat zhihuiya

Abstract:

本发明公开了一种基于宽带激励的铁磁性材料大规模损伤的低频电磁检测方法。 根据铁磁构件检测缺陷的大小,确定低频电磁传感器磁场信号的检测方向; 选择参考信号和检测信号采集位置,固定传感器与被测件之间的距离,激励啁啾信号作为宽带激励信号,进行宽带激励低频电磁检测; 计算机对采集的宽带检测信号进行处理; 以参考信号与缺陷检测信号的欧氏距离之差作为缺陷表征参数,得到具有检测位置的铁磁元件上下表面不同深度缺陷的欧氏距离曲线。 通过对低频电磁宽带检测信号的分析和处理, 利用宽带激励下的欧氏响应信号和参考信号表征材料损伤程度的变化,可有效降低磁场集肤效应的影响,有利于不同深度上下材料表面缺陷的有效表征。

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Patent Info :

Type: 发明授权

Patent No.: US17055599

Filing Date: 2020-04-29

Publication Date: 2022-11-08

Pub. No.: US11493479B2

Applicants: Beijing University Of Technology

Legal Status: 授权

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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