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Author:

侯立刚 (侯立刚.) | 高灿 (高灿.) | 赵未 (赵未.) | 彭晓宏 (彭晓宏.) | 耿淑琴 (耿淑琴.) | 汪金辉 (汪金辉.)

Indexed by:

incoPat zhihuiya

Abstract:

本发明涉及一种电路路径的测试覆盖率分析方法,内容分为识别电路路径、提取电路路径、加入监测语句、进行二次前仿真、统计测试文件群覆盖率,识别电路路径、提取电路路径、加入监测语句、进行二次前仿真、统计测试文件群覆盖率依次进行,上述五个步骤构成测试设计的整体;本发明通过监测门级网表中相关路径门的变化,找出满足电路路径覆盖率较高的测试文件群进行验证,在验证基本无误的情况下,再进行完整的时序分析验证,减少二次错误概率,减少验证时间,从而大大提高了验证效率,减少了验证人员的工作量。

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Patent Info :

Type: 发明授权

Patent No.: CN201610125352.9

Filing Date: 2016-03-04

Publication Date: 2019-03-22

Pub. No.: CN105808839B

Applicants: 北京工业大学

Legal Status: 未缴年费

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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