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Author:

石照耀 (石照耀.) (Scholars:石照耀) | 张白 (张白.)

Indexed by:

incoPat zhihuiya

Abstract:

本发明扫描测头标定方法,是基于三维坐标测量系统,针对坐标测量机、精密数控机床、齿轮测量中心等精密测量仪器领域设计的扫描测头的标定模型及实现方法,降低了标定算法对于坐标测量机的定位精度的要求,消除了算法对于测头标定过程中测头滑动带来的影响。本方法对坐标测量机的定位精度没有要求,模型结构简单,实现容易,标定速度快,可以广泛应用于三坐标测量机中的扫描测头标定。

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Patent Info :

Type: 发明授权

Patent No.: CN201310057385.0

Filing Date: 2013-02-22

Publication Date: 2015-06-17

Pub. No.: CN103115593B

Applicants: 北京工业大学

Legal Status: 授权 ; 许可

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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