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Author:

Wang, Min (Wang, Min.) | Liu, Liming (Liu, Liming.) | Song, Kaiyu (Song, Kaiyu.) | Yang, Bin (Yang, Bin.) | Wang, Chen (Wang, Chen.)

Indexed by:

EI Scopus

Abstract:

To ensure tool life and control the rejects rate of work-piece, a method to extract clutter induced by tool wear and abnormal vibration in spindle current was proposed. In addition, wear identification of end milling cutter was realized by Convolutional Neural Network (CNN).Based on the results of irregular clutter components in spindle current caused by tool wear and abnormal vibration, Fourier series fitting was used to decompose current into harmonic components and current clutter. Harmonic components reflected the quasi-static change in the current RMS and current clutter reflected the cutting edge and flank wear status of the end milling cutter and abnormal vibration. The current clutter signals were input into CNN for feature extraction and classification of end milling cutter status. Experiments results showed that the proposed method could eliminate the influence of cutting vibration and parameters on the accuracy of tool wear status identification, realize the accurate status identification of the end milling cutter and lay the foundation for predicting the remaining life of the end milling cutter and formulating the end milling cutter changing rules scientifically and rationally under complex conditions. © 2021, Editorial Department of CIMS. All right reserved.

Keyword:

Convolution Wear of materials Milling (machining) Cutting tools Milling cutters Radar clutter Fourier series Clutter (information theory) Convolutional neural networks

Author Community:

  • [ 1 ] [Wang, Min]Institute of Intelligent Monitoring and Diagnosis, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Wang, Min]Beijing Municipal Key Laboratory of EDM Technology, Beijing; 100191, China
  • [ 3 ] [Liu, Liming]Institute of Intelligent Monitoring and Diagnosis, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Song, Kaiyu]Institute of Intelligent Monitoring and Diagnosis, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Yang, Bin]Institute of Intelligent Monitoring and Diagnosis, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Wang, Chen]Institute of Intelligent Monitoring and Diagnosis, Beijing University of Technology, Beijing; 100124, China

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Source :

Computer Integrated Manufacturing Systems, CIMS

ISSN: 1006-5911

Year: 2021

Issue: 12

Volume: 27

Page: 3429-3438

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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