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Author:

Zhu, Jiangmiao (Zhu, Jiangmiao.) | Sun, Yufen (Sun, Yufen.) | Chen, Junyu (Chen, Junyu.) | Cheng, Mingfan (Cheng, Mingfan.) | Wang, Yifan (Wang, Yifan.) | Zhao, Kejia (Zhao, Kejia.)

Indexed by:

EI Scopus

Abstract:

Jitter is one of the important factors that affect the measurement accuracy of broadband sampling oscilloscopes. The description of jitter varies across different fields, and therefore, the definition and classification of jitter differ among international organizations. This paper analyzes the sources and definitions of jitter involved in the time-domain measurements of broadband sampling oscilloscopes and characterizes jitter using Root-Mean-Square Jitter (jitter rms) and Peak-to-Peak Jitter ∗(jitter p-p) for a more rigorous and accurate representation. Additionally, this paper conducts research using Keysight Flex DCA simulation software as a platform and provides the calculation methods for jitter rms and jitter p-p in the Keysight NIOOO series broadband sampling oscilloscopes. © 2023 IEEE.

Keyword:

Time domain analysis Jitter Computer software Simulation platform Cathode ray oscilloscopes

Author Community:

  • [ 1 ] [Zhu, Jiangmiao]Beijing University of Technology, Faculty of Information Technology, Beijing, China
  • [ 2 ] [Sun, Yufen]Beijing University of Technology, Faculty of Information Technology, Beijing, China
  • [ 3 ] [Chen, Junyu]Beijing University of Technology, Faculty of Information Technology, Beijing, China
  • [ 4 ] [Cheng, Mingfan]Beijing University of Technology, Faculty of Information Technology, Beijing, China
  • [ 5 ] [Wang, Yifan]Beijing University of Technology, Faculty of Information Technology, Beijing, China
  • [ 6 ] [Zhao, Kejia]Institute of Information and Electronic Metrology, National Institute of Metrology, Beijing, China

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Year: 2023

Page: 81-85

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 25

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