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Author:

An, X. (An, X..) | Li, J. (Li, J..) | Xu, S. (Xu, S..) | Chen, L. (Chen, L..) | Pi, S. (Pi, S..)

Indexed by:

Scopus

Abstract:

Patent similarity measurement, as one of fundamental building blocks for patent analysis, not only can derive technical intelligence efficiently, but also can detect the risk of infringement and evaluate whether the invention meets the criteria of novelty and innovation. However, traditional approaches make implicitly several assumptions, such as bag of words in each component, semantic direction irrelevance and so on. In order to relax these assumptions, this study proposes a novel approach on the basis of sequence alignment, which takes semantic direction of each sequence structure and the word order information of each component into consideration. Meanwhile, an algorithm for calculating the global importance of each sequence structure is put forward. Finally, to verify the effectiveness and performance of the improved semantic analysis, a case study is conducted on the thin film head subfield in the field of hard disk drive. Extensive experimental results show that our approach is significantly more accurate and is not sensitive to several core parameters. © 2020 for this paper by its authors. Use permitted under Creative Commons License Attribution 4.0 International (CC BY 4.0).

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Author Community:

  • [ 1 ] [An X.]School of Economics and Management, Beijing Forestry University, Beijing, China
  • [ 2 ] [Li J.]School of Economics and Management, Beijing Forestry University, Beijing, China
  • [ 3 ] [Xu S.]Research Base of Beijing Modern Manufacturing Development, College of Economics and Management, Beijing University of Technology, Beijing, China
  • [ 4 ] [Chen L.]Institute of Scientific and Technical Information of China, Beijing, China
  • [ 5 ] [Pi S.]School of Economics and Management, Beijing Forestry University, Beijing, China

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Source :

ISSN: 1613-0073

Year: 2020

Volume: 2658

Page: 45-49

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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