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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Mu, Yunlong (Mu, Yunlong.) | Song, Guorong (Song, Guorong.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.) (Scholars:吴斌)

Indexed by:

EI Scopus PKU CSCD

Abstract:

As a rapid and efficient nondestructive testing method, Lamb wave technology possesses great application potentials in structural health monitoring fields and has been paid considerable attention. In this paper, the wide-band linear chirp signal is chosen as the excitation signal to replace traditional narrow band tone burst signal. Through post-processing, the response signal of the chirp signal can be demodulated, and the equivalent tone burst response signals with any center frequencies in the bandwidth range of the chirp signal can be extracted. A kind of piezoelectric transducer is designed optimally, which can excite and receive the pure A0 mode signal in low frequency range. The A0 mode signal is very sensitive to the defects in plates, which makes the signal to be analyzed more conveniently. These developed piezoelectric transducers were arranged on a quasi-isotropic composite plate sparsely, and the simulated faults were detected. The detection data of the chirp signal obtained in the experiment were demodulated, and the response signals with multiple center frequencies were achieved. The elliptic imaging technique and data fusion method were combined to perform defect imaging, and the defect location in the composite plate was realized. The imaging results from the signal fusion of the response signals with multiple frequencies have higher resolution, contrast and location accuracy. ©, 2015, Science Press. All right reserved.

Keyword:

Nondestructive examination Imaging techniques Ultrasonic waves Piezoelectricity Surface waves Piezoelectric transducers Transducers Defects Structural health monitoring Plates (structural components) Data fusion

Author Community:

  • [ 1 ] [Liu, Zenghua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Liu, Zenghua]Beijing Engineering Research Center of Precision Measurement Technology and Instrument, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Mu, Yunlong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Mu, Yunlong]Beijing Engineering Research Center of Precision Measurement Technology and Instrument, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Song, Guorong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Song, Guorong]Beijing Engineering Research Center of Precision Measurement Technology and Instrument, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [He, Cunfu]Beijing Engineering Research Center of Precision Measurement Technology and Instrument, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [Wu, Bin]Beijing Engineering Research Center of Precision Measurement Technology and Instrument, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • 刘增华

    [liu, zenghua]beijing engineering research center of precision measurement technology and instrument, beijing university of technology, beijing; 100124, china;;[liu, zenghua]college of mechanical engineering and applied electronics technology, beijing university of technology, beijing; 100124, china

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Source :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

Year: 2015

Issue: 9

Volume: 36

Page: 1961-1971

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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