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Author:

Wang, Gang (Wang, Gang.) | Liu, Dongdong (Liu, Dongdong.) | Cui, Lingli (Cui, Lingli.)

Indexed by:

EI Scopus SCIE

Abstract:

Deep-learning-based intelligent diagnosis is a popular method to ensure the safe operation of rolling bearings. However, practical diagnostic tasks are often subject to a lack of labeled data, resulting in poor performance in scenarios with insufficient training samples. Moreover, conventional intelligent diagnosis methods suffer from a deficiency in interpretability. In this article, an auto-embedding transformer (AET) method is proposed to implement the interpretable few-shot fault diagnosis of rolling bearings. First, an auto-embedding module is developed to improve the embedding quality of the signal, which is designed based on a novel asymmetric convolutional encoder-decoder architecture. This module can leverage the merits of unsupervised learning in data mining and allow the transformer to learn more diagnostic knowledge from limited data. Second, an attention scoring method is proposed that utilizes positionwise attention to quantify the importance of each signal embedding for diagnosis, thereby interpreting the AET method. Experimental results confirm that, even with limited training samples, the AET method outperforms various comparison methods in terms of recognition accuracy and convergence rate. Furthermore, the attention scores assigned to each embedding facilitate the interpretability of the AET method.

Keyword:

Autoencoder rolling bearings Data mining Fault diagnosis few-shot diagnosis Transformers Rolling bearings Convolution Vibrations transformer interpretability Feature extraction

Author Community:

  • [ 1 ] [Wang, Gang]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Dongdong]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Cui, Lingli]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Liu, Dongdong]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China;;[Cui, Lingli]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China;;

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Source :

IEEE TRANSACTIONS ON RELIABILITY

ISSN: 0018-9529

Year: 2023

Issue: 2

Volume: 73

Page: 1270-1279

5 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 32

SCOPUS Cited Count: 30

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 21

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