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Author:

Wang, Y. (Wang, Y..) | Zhou, Y. (Zhou, Y..) | Zhu, W. (Zhu, W..) | Zhang, J. (Zhang, J..) | Liu, Z. (Liu, Z..) | Wang, D. (Wang, D..)

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EI Scopus SCIE

Abstract:

An interrogation method of chirped fiber Bragg grating (FBG) based on a microwave photonic filter (MPF) is proposed to realize temperature-insensitive strain measurement. In the proposed MPF, two identical chirped FBGs are embedded to form a Michelson interferometer. When strain is applied to one of the chirped FBGs, its wavelength shift will produce a change in signal transmission latency due to the chromatic dispersion of chirped FBG, resulting in a path difference for the Michelson interferometer. Consequently, a variation on the central frequency of MPF is introduced. Therefore, the wavelength shift of chirped FBG induced by strain can be interrogated by monitoring the frequency response of MPF. Moreover, the effect of ambient temperature can be compensated with the other chirped FBG. The experimental results show that frequency shift of MPF in response to strain with a sensitivity of 1.9 MHz/ μ varepsilon is achieved for a measurement range of 0 ∼ 1167~μ varepsilon . Besides, the system keeps unchanged within a temperature range from 30 °C to 100 °C.  © 1989-2012 IEEE.

Keyword:

microwave photonic filter Chirped fiber Bragg grating temperature compensation strain measurement

Author Community:

  • [ 1 ] [Wang Y.]Beijing University of Technology, Faculty of Science, Department of Physics and Optoelectronic Engineering, Beijing, 100124, China
  • [ 2 ] [Wang Y.]Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 3 ] [Zhou Y.]Beijing University of Technology, Faculty of Science, Department of Physics and Optoelectronic Engineering, Beijing, 100124, China
  • [ 4 ] [Zhou Y.]Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 5 ] [Zhu W.]Henan Institute of Metrology, Zhengzhou, Henan, 450000, China
  • [ 6 ] [Zhang J.]Beijing University of Technology, Faculty of Science, Department of Physics and Optoelectronic Engineering, Beijing, 100124, China
  • [ 7 ] [Zhang J.]Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 8 ] [Liu Z.]Beijing University of Technology, Faculty of Science, Department of Physics and Optoelectronic Engineering, Beijing, 100124, China
  • [ 9 ] [Liu Z.]Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China
  • [ 10 ] [Wang D.]Beijing University of Technology, Faculty of Science, Department of Physics and Optoelectronic Engineering, Beijing, 100124, China
  • [ 11 ] [Wang D.]Engineering Research Center of Precision Measurement Technology and Instruments, Beijing, 100124, China

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Source :

IEEE Photonics Technology Letters

ISSN: 1041-1135

Year: 2024

Issue: 2

Volume: 36

Page: 111-114

2 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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