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Author:

Sun, Y. (Sun, Y..) | Dong, M. (Dong, M..) | Yu, M. (Yu, M..) | Zhu, L. (Zhu, L..)

Indexed by:

EI Scopus SCIE

Abstract:

To alleviate the problems of long training time and computational resource consumption in diffractive deep neural networks (D2NNs), we present the 2bit nonlinear diffractive deep neural network (2bit ND2NN) model, which employs the concept of quantized neural networks. 2bit ND2NN converts the phase of each diffraction layer pixel from continuous to discrete values, i.e., the five regions of 0, π/2, π, 3π/2 and 2π. We use the formulas for phase and relative thickness to determine the thickness values of the pixels. Furthermore, the phase and amplitude of neurons in the 2bit ND2NN model are both considered as learnable parameters. We use a revised formula to determine the size of neurons in the model, and we determine the diffraction grating spacing, the number of grating layers, the pixel size and the pixel counts through ablation experiments. Experimental results for image classification indicate that the highest accuracy achieved by 2bit ND2NN on the MNIST and Fashion-MNIST datasets is 97.88 % and 89.28 %, respectively. © 2024

Keyword:

Diffractive Deep Neural Network Optical neural network Nonlinear optics

Author Community:

  • [ 1 ] [Sun Y.]Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Sun Y.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 3 ] [Sun Y.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangdong, 511462, China
  • [ 4 ] [Dong M.]Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Dong M.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 6 ] [Yu M.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 7 ] [Yu M.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangdong, 511462, China
  • [ 8 ] [Zhu L.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 9 ] [Zhu L.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangdong, 511462, China

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Source :

Optics and Laser Technology

ISSN: 0030-3992

Year: 2024

Volume: 177

5 . 0 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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