• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Lian, C. (Lian, C..) | Yang, K. (Yang, K..) | Liu, A. (Liu, A..) | Cheng, W. (Cheng, W..)

Indexed by:

Scopus SCIE

Abstract:

The skewed generalized normal (SGN) distribution with four parameters is a versatile distribution that can effectively model data with skewness and heavy or light tails. In this paper, we conduct two classes of goodness of fit tests for the SGN distribution based on the empirical distribution function (edf) and the sample correlation coefficient. The first class involves transforming the sample into approximately mixed gamma observations, and then applying five classical parametric bootstrap edf-based goodness of fit tests. The second class is based on the inverse probability transformation and utilizes the sample correlation coefficient as the test statistic. We compare the finite sample performances of the proposed tests for different sample sizes and alternative distributions by extensive numerical studies. The simulation results demonstrate that the proposed tests provide a valid alternative to the standard tests using the original data, and the analysis of real data illustrates its application. © 2024 Informa UK Limited, trading as Taylor & Francis Group.

Keyword:

Goodness of fit tests empirical distribution function skewed generalized normal distribution bootstrap

Author Community:

  • [ 1 ] [Lian C.]School of Mathematics, Statistics and Mechanics, Beijing University of Technology, Beijing, China
  • [ 2 ] [Yang K.]School of Mathematics, Statistics and Mechanics, Beijing University of Technology, Beijing, China
  • [ 3 ] [Liu A.]School of Mathematics, Statistics and Mechanics, Beijing University of Technology, Beijing, China
  • [ 4 ] [Cheng W.]School of Mathematics, Statistics and Mechanics, Beijing University of Technology, Beijing, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Source :

Journal of Statistical Computation and Simulation

ISSN: 0094-9655

Year: 2024

Issue: 12

Volume: 94

Page: 2646-2678

1 . 2 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Affiliated Colleges:

Online/Total:479/10580424
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.