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Author:

Kang, Rong (Kang, Rong.) | Dai, Yanwei (Dai, Yanwei.) | Qin, Fei (Qin, Fei.) | Li, Yanning (Li, Yanning.)

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CPCI-S EI

Abstract:

In this paper, the thickness effect of sintered silver layer was investigated based on end-notched flexure (ENF) test, and the sensitivity of shear fracture behavior of sintered silver joints with different thickness under the same strain rate was investigated. Four kinds of sintered silver joint ENF samples with four kinds of sintered silver layer thickness were prepared on two pieces of bare copper with 50 μm, 100 μm, 150 μm and 200 μm thick steel screen printing silver paste. The loading rate is 0.2 mm/min, and the three-point bending test is carried out on the Instron 5948 micro tester. The fracture morphology and microstructure of the sintered silver layer after ENF test are analyzed by Hitachi S4000 scanning electron microscope (SEM) and optical microscope (OM). The compliance based beam method (CBBM) is used to fracture analysis of the specimen. Under certain quasi-static loading conditions, the shear fracture toughness of sintered silver increases with the increase of the thickness of sintered silver layer, and the porosity of sintered silver gradually decreased to a stable value. © 2023 IEEE.

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Author Community:

  • [ 1 ] [Kang, Rong]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Faculty of Materials and Manufacturing, Beijing, China
  • [ 2 ] [Dai, Yanwei]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Faculty of Materials and Manufacturing, Beijing, China
  • [ 3 ] [Qin, Fei]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Faculty of Materials and Manufacturing, Beijing, China
  • [ 4 ] [Li, Yanning]Beijing University of Technology, Institute of Electronics Packaging Technology and Reliability, Faculty of Materials and Manufacturing, Beijing, China

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Year: 2023

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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