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Author:

Chang, Peng (Chang, Peng.) | Wang, Pu (Wang, Pu.) | Gao, Xuejin (Gao, Xuejin.) (Scholars:高学金) | Qi, Yongsheng (Qi, Yongsheng.) | Zhang, Yachao (Zhang, Yachao.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Traditional MKPLS method conducts the covariance matrix decomposition of the data matrix, and some useful high-order statistics are not used, which will cause the loss of the useful data information in the feature extraction process and lead to poor fault recognition performance. Aiming at this issue, a multi-way statistics pattern analysis kernel partial least squares method (MSPAKPLS) is proposed, which combines the statistics pattern analysis (SPA) with multi-way kernel partial least squares (MKPLS). This method first introduces a slide window technique to construct different order statistics of the data sample; the data are mapped from the original data space into the statistic sample space, then the kernel function is used to map the data from the statistic sample space into the high dimensional kernel space, and the PLS analysis and product quality prediction are conducted. At last, this method was applied in the industrial penicillin fermentation process and compared with some conventional methods; the results show that the proposed method has better monitoring and prediction performance.

Keyword:

Covariance matrix Least squares approximations Statistics Forecasting Batch data processing Process monitoring Process control

Author Community:

  • [ 1 ] [Chang, Peng]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wang, Pu]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Gao, Xuejin]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Qi, Yongsheng]School of Electric Power, Inner Mongolia University of Technology, Huhhot 010051, China
  • [ 5 ] [Zhang, Yachao]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

Year: 2014

Issue: 6

Volume: 35

Page: 1409-1416

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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