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Author:

Chu, Hongyan (Chu, Hongyan.) | Dong, Yuefeng (Dong, Yuefeng.) | Cheng, Qiang (Cheng, Qiang.) | Yan, Jun (Yan, Jun.) | Zhao, Yongsheng (Zhao, Yongsheng.) | Cao, Jianqiang (Cao, Jianqiang.) | Zhang, Caixia (Zhang, Caixia.) | Chen, Xuehan (Chen, Xuehan.)

Indexed by:

Scopus SCIE

Abstract:

Product quality in manufacturing is directly related to the reliability, durability and safety of the product. Product quality can be controlled by building a product control chart pattern recognition model. The complexity and temporal sequence of product quality data make it difficult to extract effective control chart features, and it is difficult for common classifiers to play an effective role for each control chart pattern category, thus affecting the accuracy of pattern recognition. Therefore, this paper proposes a data feature enhancement processing method that combines Smote algorithm and smooth shift processing. This method reveals data features by performing feature enhancement processing on raw data and extracts statistical and shape features for dimensionality reduction to improve recognition accuracy and efficiency. Based on this approach, this paper also proposes an ensemble learning model based on the Stacking method, which incorporates BP, ELM, PNN and SVM classifiers for control chart pattern recognition. Through extensive experimental validation, the data feature enhancement method improves the accuracy of the weak classifier normal pattern recognition by 30%, and effectively reduces the misclassification in the quality control process. The ensemble learning model is stronger than the weak classifier, and its recognition accuracy can reach 97.31%.

Keyword:

Quality intelligent prediction pattern recognition data enhancements ensemble learning classifiers

Author Community:

  • [ 1 ] [Chu, Hongyan]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Dong, Yuefeng]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Cheng, Qiang]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Yan, Jun]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Zhao, Yongsheng]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Cao, Jianqiang]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Zhang, Caixia]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Chu, Hongyan]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Dong, Yuefeng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 10 ] [Cheng, Qiang]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 11 ] [Yan, Jun]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 12 ] [Zhao, Yongsheng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 13 ] [Cao, Jianqiang]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 14 ] [Zhang, Caixia]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 15 ] [Chen, Xuehan]Jiangxi Tianyue Auto Elect Co, Tianyue, Jiangxi, Peoples R China

Reprint Author's Address:

  • [Yan, Jun]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China;;[Yan, Jun]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China;;

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Source :

INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH

ISSN: 0020-7543

Year: 2024

9 . 2 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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