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Author:

Wang, Yanhao (Wang, Yanhao.) | Geng, Yirong (Geng, Yirong.) | Hao, Hongwei (Hao, Hongwei.) | Ren, Wei (Ren, Wei.) | Zhang, Hai (Zhang, Hai.) | Li, Jingjie (Li, Jingjie.) | Zhang, Yongzhe (Zhang, Yongzhe.) | Wang, Jilei (Wang, Jilei.) | Bao, Shaojuan (Bao, Shaojuan.) | Wang, Hui (Wang, Hui.) | Zhang, Shan-Ting (Zhang, Shan-Ting.) | Li, Dongdong (Li, Dongdong.)

Indexed by:

Scopus SCIE

Abstract:

Effective surface passivation is pivotal for achieving high performance in crystalline silicon (c c- Si) solar cells. However, many passivation techniques in solar cells involve high temperatures and cost. Here, we report a low-cost and easy-to-implement sulfurization treatment as a surface passivation strategy. By treating p- type c- Si (p p- Si) wafers with (NH4)2S 4 ) 2 S solution, sulfur can be introduced onto the surface and passivate the dangling bonds by forming an Si-S bond. Sulfurization also contributes to a higher negative fixed charge at the p- Si/Al 2 O 3 interface and, thus, better field-effect passivation. Due to the improved passivation, sulfurization effectively enhances hole selectivity, evidenced by the substantially improved open-circuit voltage and efficiency of solar cells. Eventually, by employing sulfurization in hole-selective contacts, remarkable efficiencies of 19.85% and 22.01% are attained for NiOx- x- and MoOx-based x-based passivating contact c- Si solar cells, respectively. Our work highlights a promising sulfurization strategy to enhance surface passivation and hole selectivity for dopant-free c- Si solar cells.

Keyword:

Author Community:

  • [ 1 ] [Wang, Yanhao]Chinese Acad Sci, Shanghai Adv Res Inst, 99 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 2 ] [Hao, Hongwei]Chinese Acad Sci, Shanghai Adv Res Inst, 99 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 3 ] [Wang, Hui]Chinese Acad Sci, Shanghai Adv Res Inst, 99 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 4 ] [Li, Dongdong]Chinese Acad Sci, Shanghai Adv Res Inst, 99 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 5 ] [Wang, Yanhao]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 6 ] [Hao, Hongwei]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 7 ] [Zhang, Hai]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 8 ] [Zhang, Shan-Ting]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 9 ] [Li, Dongdong]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China
  • [ 10 ] [Geng, Yirong]Shanghai Univ, Phys Dept, Int Ctr Quantum & Mol Struct, Shanghai Key Lab High Temp Supercond, Shanghai 200444, Peoples R China
  • [ 11 ] [Ren, Wei]Shanghai Univ, Phys Dept, Int Ctr Quantum & Mol Struct, Shanghai Key Lab High Temp Supercond, Shanghai 200444, Peoples R China
  • [ 12 ] [Zhang, Hai]Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 13 ] [Li, Jingjie]Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 14 ] [Zhang, Yongzhe]Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 15 ] [Wang, Jilei]Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China
  • [ 16 ] [Wang, Yanhao]Univ Chinese Acad Sci, Sch Integrated Circuits, 19 Yuquan Rd, Beijing 100049, Peoples R China
  • [ 17 ] [Hao, Hongwei]Univ Chinese Acad Sci, Sch Integrated Circuits, 19 Yuquan Rd, Beijing 100049, Peoples R China
  • [ 18 ] [Bao, Shaojuan]Anhui Baicheng Huitong Technol Co Ltd, Hefei 230000, Peoples R China

Reprint Author's Address:

  • [Li, Dongdong]Chinese Acad Sci, Shanghai Adv Res Inst, 99 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China;;[Zhang, Shan-Ting]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China;;[Li, Dongdong]Zhangjiang Lab, 100 Haike Rd,Zhangjiang Hitech Pk, Shanghai 201210, Peoples R China;;[Ren, Wei]Shanghai Univ, Phys Dept, Int Ctr Quantum & Mol Struct, Shanghai Key Lab High Temp Supercond, Shanghai 200444, Peoples R China;;

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Source :

CELL REPORTS PHYSICAL SCIENCE

Year: 2024

Issue: 9

Volume: 5

8 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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