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Author:

Zhou, Wei (Zhou, Wei.) | Deng, Wenhao (Deng, Wenhao.) | Ji, Zhihao (Ji, Zhihao.) | Ji, Xiaoliang (Ji, Xiaoliang.) | Ma, Liming (Ma, Liming.) | Lin, Pengrong (Lin, Pengrong.) | Guo, Fu (Guo, Fu.) (Scholars:郭福)

Indexed by:

EI Scopus SCIE

Abstract:

The accelerated application research of power electronic devices intensively stimulates the interconnect materials to catch the ability of low-temperature sintering and high-temperature service. Herein, the uniform micro/nano-hybrid structure particles, which are Ag nanoparticles decorated on the surface of Cu microparticles (Cu MPs@Ag NPs), are fabricated by a mild one-step liquid-phase reduction method. XRD and TG analysis results demonstrate Cu MPs@Ag NPs obtain better anti-oxidation than Cu MPs, which is caused by the decorated Ag NPs. Meanwhile, bare Cu-Cu bonding with Cu MPs@Ag NPs paste is achieved at 200 degrees C, 250 degrees C, and 300 degrees C in the air. The average strength of the Cu-Cu joint reached 29.6 MPa at 300 degree celsius. Additionally, it is found that the fracture mode of the Cu-Cu joint changes from brittle fracture to ductile fracture when the sintering temperatures increase. This work demonstrates the facilely synthesized micro/nano-hybrid structure particles (Cu MPs@Ag NPs) possess the potential application in high-power density electronic packaging.

Keyword:

Author Community:

  • [ 1 ] [Zhou, Wei]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Deng, Wenhao]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Ji, Zhihao]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Ji, Xiaoliang]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Ma, Liming]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Guo, Fu]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 7 ] [Lin, Pengrong]Beijing Microelect Technol Inst, Beijing 100076, Peoples R China
  • [ 8 ] [Guo, Fu]Beijing Informat Sci & Technol Univ, Sch Mech & Elect Engn, Beijing 100192, Peoples R China

Reprint Author's Address:

  • [Zhou, Wei]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China;;[Guo, Fu]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100124, Peoples R China;;[Lin, Pengrong]Beijing Microelect Technol Inst, Beijing 100076, Peoples R China;;[Guo, Fu]Beijing Informat Sci & Technol Univ, Sch Mech & Elect Engn, Beijing 100192, Peoples R China;;

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Source :

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN: 0957-4522

Year: 2024

Issue: 24

Volume: 35

2 . 8 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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