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Author:

Li, H. (Li, H..) | Guo, C. (Guo, C..) | Wang, Y. (Wang, Y..) | Du, H. (Du, H..)

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EI Scopus

Abstract:

The new power IGBT module is widely used in new application scenarios such as high voltage and high frequency, which is an important research direction of the development of information science. In this paper, the influence of uneven temperature between multiple chips on the short-circuit operation of IGBT module is analyzed, a three-dimensional model is established and analyzed by finite element method. After creating the temperature condition of uneven temperature distribution caused by the degradation of some heat dissipation conditions, the temperature distribution and heat flux distribution of IGBT module under this temperature condition are simulated, This paper analyzes the influence of uneven temperature between multiple chips in IGBT module on the short-circuit operation of IGBT module, and puts forward some reliability suggestions for the wide application of IGBT in high-frequency and high-voltage occasions. © 2024 SPIE.

Keyword:

information science IGBT short-circuit uneven temperature

Author Community:

  • [ 1 ] [Li H.]Department of Information Science, Beijing University of Technology, Beijing, China
  • [ 2 ] [Guo C.]Department of Information Science, Beijing University of Technology, Beijing, China
  • [ 3 ] [Wang Y.]Department of Information Science, Beijing University of Technology, Beijing, China
  • [ 4 ] [Du H.]Department of Information Science, Beijing University of Technology, Beijing, China

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ISSN: 0277-786X

Year: 2024

Volume: 13286

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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