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Author:

Li, Yongzhen (Li, Yongzhen.) | Liao, Husheng (Liao, Husheng.) (Scholars:廖湖声)

Indexed by:

Scopus SCIE

Abstract:

Multi-view clustering, which improves clustering performance by exploring complementarity and consistency among multiple distinct feature sets, is attracting more and more researchers due to its wide applications in various fields e.g., pattern recognition and data mining. Traditional approaches usually explore above characteristics by mapping different views to a unified embedding through view-specific mapping matrices or neural networks. Then the unified embedding is fed into conventional single view clustering algorithms for final clustering results. However, a unified embedding is not enough to model distinct or even conflict multiple view characteristics due to their diverse representation abilities. Moreover, clustering and embedding learning are divided into two separate parts, which may bring in a gap between the class label and the learned embedding. To alleviate above problems, both unified and view-specific embeddings are learned, and a shared operator tensor and view-specific latent variables are introduced for their relationship modeling. Besides, a Kullback-Liebler divergence based objective is developed as a clustering oriented constraint, which leads to more clustering friendly embedding learned. Extensive experiments are conducted on six widely used datasets, achieving better results compared with several state-of-the-art approaches.

Keyword:

Clustering friendly embedding learning Kullback-Liebler divergence Multi-view clustering Embeddings relationship modeling

Author Community:

  • [ 1 ] [Li, Yongzhen]Beijing Univ Technol, Informat Dept, Beijing, Peoples R China
  • [ 2 ] [Liao, Husheng]Beijing Univ Technol, Informat Dept, Beijing, Peoples R China
  • [ 3 ] [Li, Yongzhen]Beijing Univ Civil Engn & Architecture, Sch Elect & Informat Engn, Beijing, Peoples R China

Reprint Author's Address:

  • 廖湖声

    [Liao, Husheng]Beijing Univ Technol, Informat Dept, Beijing, Peoples R China

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Source :

PATTERN ANALYSIS AND APPLICATIONS

ISSN: 1433-7541

Year: 2025

Issue: 1

Volume: 28

3 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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