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Author:

Na, Weicong (Na, Weicong.) | Bai, Taiqi (Bai, Taiqi.) | Liu, Ke (Liu, Ke.) | Zhang, Wanrong (Zhang, Wanrong.) (Scholars:张万荣) | Zhang, Qi-Jun (Zhang, Qi-Jun.)

Indexed by:

EI Scopus SCIE

Abstract:

Automated Model Generation (AMG) algorithms are an important technique for creating Artificial Neural Network (ANN) models in microwave design automation. AMG integrates all the subtasks in ANN development into a unified automated algorithm. The assessments of the ANN training phenomena related to under-learning, over-learning and good-learning are automated and the quantitative links between the accuracy of the ANN model, the amount/distribution of training/testing data, and the size of the neural network are established. In this way, the AMG algorithm automatically creates an ANN model with user-desired accuracy, significantly reducing the human time required for modeling. This paper introduces the state of the art in AMG algorithms and its applications in microwave modeling.

Keyword:

Heuristic algorithms Artificial neural networks Nonhomogeneous media Microwave theory and techniques Sampling methods Training Sensitivity Accuracy Microwave circuits Integrated circuit modeling

Author Community:

  • [ 1 ] [Na, Weicong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Bai, Taiqi]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Wanrong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Ke]Tianjin Univ, Sch Microelect, Tianjin 300072, Peoples R China
  • [ 5 ] [Zhang, Qi-Jun]Carleton Univ, Dept Elect, Ottawa K1S 5B6, ON, Canada

Reprint Author's Address:

  • [Na, Weicong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China

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Source :

IEEE MICROWAVE MAGAZINE

ISSN: 1527-3342

Year: 2025

Issue: 2

Volume: 26

Page: 18-30

3 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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