xTiO(2)-(1-x)SiO2　(x　=　2.9　similar　to　8.2　mol%)　glass　specimens　were　synthesized　using　the　flame　hydrolysis　technique.　This　study　aimed　to　elucidate　the　influence　of　TiO2　incorporation　on　the　optical　characteristics,　defect　behavior,　and　microwave　dielectric　performance　of　these　materials.　UV-vis　and　near-infrared　spectroscopic　analyses　were　employed　to　investigate　the　hydroxyl　and　optical　bandgap　properties.　Electron　paramagnetic　resonance　(EPR)　and　AC　impedance　spectroscopy　were　utilized　to　examine　oxygen　vacancies,　Ti3+　defects,　and　their　respective　behaviors.　The　findings　revealed　that,　with　increasing　TiO2　content,　the　generation　and　migration　of　defects　became　more　favorable,　consequently　leading　to　higher　dielectric　losses.　The　imaginary　component　of　the　electric　modulus　experimental　data　was　fitted　using　the　modified　Kohlrausch-Williams-Watts　(KWW)　function,　while　the　frequency-dependent　AC　conductivity　was　analyzed　using　the　Jonscher　power　law.　The　calculated　activation　energy　exhibited　a　decreasing　trend　with　increasing　TiO2　content,　consistent　with　the　characteristics　of　doubly　ionized　oxygen　vacancies,　suggesting　the　involvement　of　identical　charge　carriers　in　the　relaxation　and　conduction　mechanisms.　Notably,　the　8.2TiO(2)-91.8SiO(2)　glass　specimen　demonstrated　exceptional　microwave　dielectric　performance,　exhibiting　epsilon(r)　=　4.13,　Q　x　f　=　57,116　GHz,　and　tau(f)　=　-4.32　ppm/degrees　C,　rendering　it　a　promising　candidate　for　microwave　substrate　applications.