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Author:

Liu, Yan (Liu, Yan.) | Suo, Hongli (Suo, Hongli.) (Scholars:索红莉) | Zhang, Zili (Zhang, Zili.) | Ji, Yaotang (Ji, Yaotang.) | Wang, Lei (Wang, Lei.) | Liu, Jianhua (Liu, Jianhua.) | Wang, Qiuliang (Wang, Qiuliang.)

Indexed by:

EI Scopus SCIE

Abstract:

The metallic substrate of commercial REBCO tapes from eight different manufacturers has been systematically investigated. Tensile properties at both room temperature and 77 K were measured. The grain morphology, size, orientation, dislocation density, and internal stress of the grains on both the cross-section and surface of each tape were studied using EBSD. After an in-depth analysis of the relationship between yield strength and grain size, elemental composition, dislocation density, and twin boundaries, it has been preliminarily confirmed that dislocation density is a possible dominant factor in determining the yield strength of the metallic substrate of commercial REBCO tapes.The kernel average misorientation value (KAM) of the cross-section could be one of the best indicators for evaluating yield strength. Based on this analysis, potential methods for enhancing yield strength are also briefly discussed. This investigation aims to provide valuable insights for researchers to better understand the mechanical properties of REBCO tape.

Keyword:

EBSD Yield strength Hastelloy C-276 substrate Commercial REBCO tape

Author Community:

  • [ 1 ] [Liu, Yan]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 2 ] [Suo, Hongli]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 3 ] [Ji, Yaotang]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China
  • [ 4 ] [Zhang, Zili]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 5 ] [Wang, Lei]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 6 ] [Liu, Jianhua]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 7 ] [Wang, Qiuliang]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China
  • [ 8 ] [Wang, Lei]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 9 ] [Liu, Jianhua]Univ Chinese Acad Sci, Beijing 100049, Peoples R China
  • [ 10 ] [Wang, Qiuliang]Univ Chinese Acad Sci, Beijing 100049, Peoples R China

Reprint Author's Address:

  • 索红莉

    [Suo, Hongli]Beijing Univ Technol, Fac Mat & Mfg, Key Lab Adv Funct Mat, Minist Educ, Beijing 100022, Peoples R China;;[Zhang, Zili]Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China

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Source :

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS

ISSN: 0921-4534

Year: 2025

Volume: 629

1 . 7 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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